Model 58173 LED Total Power Test System


Key Features:

  • Wide LED power test range (200V/2A)
  • Chroma Huge Photo Detector (Measurement Angle=128°)
  • Semi-automatic LED wafer/chip prober
  • Unique Edge Sensor with stable probe pressure with fatigue and pressure change problem
  • Machine visual position system to minimize the time for manual operation
  • Auto sampling test function
  • Flexible and adjustable software operating interface
  • Fast wafer scanning system
  • Auto broken chip scanning algorithm
  • Lends hood design to eliminate the interference of background light
  • Real-time displaying single spot data scatter diagram
  • Comprehensive mass production test statistic report and analysis tool



  • Semi-automatic LED wafer/chips prober
  • Leakage test module
  • Source/measure module
  • Optical test module
  • Optional ESD test module

The Chroma 58173, in automatic operation, comes with unique design and a whole new method for LED total power measurement. In bare wafer/ chip LED test production, partial flux correction of total flux is the common measurement method in LED epitaxy industry. (See Figure 1 on flip page) However, conventional method causes some disadvantages, i.e., lower accuracy, low S/N ratio, and slow test time etc., and which are difficult to be applied on LED bar wafer/chip total power/flux test production.

Chroma has developed a high speed and high accuracy measurement method of LED total power/flux. (See Figure 2 on flip page) Appling this innovative test method enhances to gather more LED partial flux than using the conventional method. (See Figure 1 on flip page) It improves the accuracy dramatically and significantly.

Benefited Chroma’s unique optical and mechanical design, LED total radiant flux will be collected by a wide photo detector. Other optical features like dominant wavelength, peak wavelength, CCT, etc. will be detected by Chroma’s spectrometer. In addition, the 58173 offers a 6-inch wafer chuck and a packaged LED holder which users can collect variety of samples in one station. With a wide range of power source and meter, users can gather all of LED electrical data like forward voltage, leakage current, and reverse break voltage in one test step.

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