Chroma

58173-fc-01

Model 58173-FC LED Flip Chip Total Power Test System

58173-p

Key Features:

  • Wide LED power test range (200V/2A)
  • Chroma Huge Photo Detector (Measurement Angle=148°)
  • Semi-automatic LED wafer/chip prober
  • Unique chuck design that has no vacuum holes in the testing area
  • Unique Edge Sensor with stable probe pressure with fatigue and pressure change problem
  • Unique screen intuitive pin adjustment
  • Machine visual position system to minimize the time for manual operation
  • Combining Prober and Tester to boost the efficiency
  • Auto sampling test function
  • Broad chip scale application (to meet the tests from Chip Size 7 to 120 mil)
  • Flexible and adjustable software operating interface
  • Fast chip scanning system
  • Auto broken wafer scanning algorithm
  • Lends hood design to eliminate the interference of background light
  • Real-time displaying single spot data scatter diagram

 
 

Hardwares

  • Unique chuck design that has no vacuum holes in the testing area.
  • Chroma Huge Photo Detector (Measurement Angle=148°)
  • Semi-automatic LED wafer/chip prober
  • Wide LED power test range (200V/2A)
  • Optional ESD test module

The Chroma 58173-FC, semi-automatic LED wafer/ chip prober machine, is designed for flip-chip type LED. No vacuum holes design in transparent chuck (see figure 1), thus no interference along the optical path, and it makes the measurement more accurate.

The 58173-FC also applies Chroma’s innovative total power measurement method, (See figure2), which may collect more LED partial flux than the conventional probers, and that also improves the speed and accuracy significantly.

Benefited from Chroma’s unique optical and mechanical design, all LED’s optical parameters, such as total radiant flux, dominant wavelength, peak wavelength, CCT, etc. , can be measured fast and accurately. For LED’s electrical parameters, with a wide range of power source and meter in the system, users can gather all of LED electrical data like forward voltage, leakage current, and reverse break voltage in one test step.

The 58173-FC integrates Prober and Tester completely that has flexible software operating interface and the best logic algorithm to increase the production efficiency significantly. The comprehensive mass production statistic reports and analysis tools allow the user to master the production status easily.


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